Automating test generation for discrete event oriented embedded systems

A method for the automatic generation of test scenarios from the behavioral requirements of a system is presented in this paper. The generated suite of test scenarios validates the system design or implementation against the requirements. The approach proposed here uses a requirements model and a set of four algorithms. The requirements model is an executable model of the proposed system defined in a deterministic state-based modeling formalism. Each action in the requirements model that changes the state of the model is identified with a unique requirement identifier. The scenario generation algorithms perform controlled simulations of the requirements model in order to generate a suite of test scenarios applicable for black box testing. Measurements of several metrics on the scenario generation algorithms have been collected using prototype tools.